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Phase Coherence Imaging for Flaw Detection

By Alain Le Duff, Guillaume Painchaud-April

1. Introduction

In the field of ultrasonic nondestructive testing (NDT), the total focusing method (TFM) is now a widely known and accepted nondestructive testing (NDT) imaging technique. Moreover, the method is now commercially available on several portable devices, including OmniScan™ X3 series flaw detectors, and TFM is growing in popularity within the NDT community.

However, although TFM enables easier image interpretation than conventional phased array (PA) inspection, the use of a single element in transmission during acquisition can result in images with a low signal-to-noise ratio (SNR). This low SNR is due to poor acoustic penetration, typically in thick parts or in highly attenuative material.

To overcome this issue, a different implementation of the conventional TFM algorithm using only the phase-related information of the acquired signals is proposed here. It is based on the vector coherence factor (VCF)1, which is used as an image itself removing the amplitude information from the acquired signals. This method, also generally known as phase coherence imaging (PCI), presents certain advantages,2,3,4 including the following:

The remainder of this document explains the basic principles of Evident’s PCI technology, a portion of which is patent pending; notably, its method of producing binarized representations of acoustic echo signals. For this explanation, the operation of the delay and sum (DAS) algorithm, which makes it possible to construct a conventional TFM image with an envelope from the FMC, is first reviewed. Then, it will be demonstrated that the PCI algorithm constitutes a variant of the DAS algorithm.

Examples from real use cases using artificial defects of known nature and geometry permit the comparison of the two types of images, conventional TFM and PCI5, obtained using the two types of algorithms.

2. Review of the Principles of Conventional TFM and the DAS Algorithm

Figure 1. Geometric configuration of FMC acquisition with a probe in contact with the test surface. The piezoelectric element k emits an ultrasonic acoustic wave into the material. The piezoelectric element l receives the reflected ultrasonic sound wave.

Figure 1 shows the geometric configuration of full matrix capture (FMC) acquisition from a phased array ultrasonic testing probe (PAUT) as well as the region of interest (ROI) corresponding to the portion of the specimen to be inspected and viewed using TFM. The piezoelectric element k emits an ultrasonic sound wave. This acoustic wave then propagates in the material of the specimen to be inspected and is reflected by any defects present in the material as well as by the various interfaces. The piezoelectric element l receives the reflected ultrasonic acoustic wave, which leads to the formation of the A-scan signal. skl . The FMC then groups all the A-scans for all the possible kl combinations.

Figure 2 provides a flowchart illustrating in 6 main steps the principle of the delay and sum (DAS) algorithm’s reconstruction of a conventional TFM image from an FMC acquisition:

  1. The FMC acquisition is performed, which generates the data consisting of all the A-scans s kl I (t). The exponent I indicates here that these A-scans are the in-phase signals.
  2. The Hilbert transform is applied, making it possible to obtain the quadrature components s kl Q (t) of the in-phase A-scans s kl I (t) acquired and grouped in the FMC data.
  3. The x kl I and x kl Q data are extracted using the precalculated delays τ kl (x,z). These delays were precalculated according to the type of mode selected (L-L, T-T, TT-T, TT-TT, for example) and the ROI to be observed.
  4. The summation then obtains two TFM images in quadrature, I TFM I (x,z) and I TFM Q (x,z).
  5. The amplitude (also called module or envelope) I TFM (x,z) is estimated using the Euclidean distance calculation.
  6. A post-processing step, enabled by the graphics card, then formats (essentially digital filtering, resampling, and resizing) the TFM image, which is presented to the user on the display of the instrument.

Figure 2. Principle of the 6-step DAS algorithm for obtaining an amplitude TFM image from an FMC acquisition.

3. Principles of the PCI Algorithm

A principal differentiator of the PCI algorithm implemented in the OmniScan X3 64 flaw detector from conventional TFM and other phase-based signal processing technologies is that it contains an innovative acoustic signal binarization component (patent pending). If we compare the PCI algorithm to the steps in the DAS algorithm shown in Figure 2, it differs in two main respects:

3.1. Concept of Phase Coherence

Enabling a good understanding of the nature of PCI necessitates the introduction of the notion of signal coherence, a fundamental principle of this method. This paragraph introduces the concept in a simplified form. For this, attention must be paid to the operation of the function sign, sometimes called the signum function.

The function sign quantifies a signal s(t) on 3 distinct levels, +1, 0, and -1:

To better understand the effect of this quantification operation on the signals, figure 3 shows, by way of an example, the result of the application of the function sign on an A-scan s(t), chosen here arbitrarily for demonstration purposes. By observing Figure 3, it is possible to note the following:

The behavior of the function sign is therefore used in PCI,5 on the one hand, to maintain consistent signal intensity—regardless of the depth of investigation, for example—and on the other hand, to separate the coherent zones, likely corresponding to the presence of defects, and the noncoherent chaotic zones corresponding to an absence of flaws. It should be noted that the coherence of the signals is information carried by the phase of the signal.

From a certain perspective, the information communicated by PCI can be considered as quasi-binary in nature, in that “coherence/noncoherence” equals “presence of a defect/absence of defect.” The problem then consists of adopting a strategy that separates these two regimes. The way or ways that this can be accomplished is not addressed in this document, but an adapted color map, such as the one implemented in OmniScan X3 64 flaw detector, assists the task of separation.

Figure 3. Raw A-scan type signal and noise (a) and quantized signal using the function sign (b).

3.2. PCI Algorithm

Figure 4. Principle of the PCI algorithm.

The flowchart in Figure 4 summarizes the PCI algorithm implemented in OmniScan™ X3 64 flaw detector as follows:

  1. Acquisition phase that constructs the FMC data consisting of all the A-scans s kl I (t). The exponent I indicates that these A-scans are in-phase signals.
  2. Application of the Hilbert transform, which makes it possible to obtain the components in quadrature s kl Q (t) of the in-phase A-scans s kl I (t) acquired and grouped in the FMC data.
  3. Extraction of the data x kl I and x kl Q using the delays τ kl (x,z). These delays have been calculated beforehand according to the type of mode selected (L-L, T-T, TT-T, TT-TT, for example) and the ROI to be observed.

These first three steps are identical to those of the DAS algorithm in Figure 2.

3b. Quantization of the signals xklI and xklQ using the sign function according to equation 1, which leads to signals yklI and yklQ:

Step 3b is an additional step specific to the PCI algorithm.

4. The summation obtains two PCI images in quadrature, IPCII (x,z) and IPCIQ (x,z):

5. Finally, the amplitude IPCI (x,z) is estimated using the calculation of the Chebyshev distance, also called the uniform norm, or norm L, and the two components of equations (3) and (4):

with p→∞.

Estimating the amplitude from equation 5 is difficult to achieve with p→∞. A good approximation can then be obtained using the following expression:

That is, by retaining as the final value the maximum of the absolute values (|⋅|) of the in-phase and quadrature images.

6. Finally, there is a post-processing step, identical to that of the DAS algorithm used to obtain a conventional TFM image, enabled by the graphics card, that formats (essentially, digital filtering, resampling, and resizing) the TFM image that is presented to the user on the instrument screen.

It is worth noting that the PCI processing workflow as shown in Figure 4 and implemented in the OmniScan X3 64 flaw detector is completed during the inspection in real time at relatively the same speed (i.e., from data acquisition to image generation) as the device’s conventional TFM.

4. Experimental Examples

Two examples, excerpts from experimental measurements on defects of a known nature and geometry, are presented here to compare images obtained using the two algorithms previously described and to highlight certain characteristics of PCI. These include amplitude robustness and defect tip sensitivity.

4.1. Example 1: Side-Drilled Hole (SDH) Block

The first test example aims to highlight the attenuation robustness property of the PCI method. A block of steel containing 17 SDHs (ASTM E2491 low-carbon steel test block) is inspected without a wedge (i.e., the probe is in direct contact with the part to be inspected) using a 5L64-A32 PAUT probe. This testing configuration is shown in Figure 5.

Figure 6 shows the resulting reconstructed conventional TFM (a) and PCI (b,c) images using the L-L propagation mode. In Figure 6, we can clearly observe the following:

As PCI is an amplitude-free imaging method, the coherent summation of signals happens independently of the amplitude of the signals, and thus produces indications with a high contrast level.3

Figure 5. Example 1 test configuration: ASTM E2491 low-carbon steel test block and 5L64-A32 probe.

Figure 6. SDH imaging using conventional TFM (a), PCI (b), and PCI with the default colormap implemented in the OmniScan X3 64 flaw detector.

4.2. Example 2: Notch Defect in a Steel Block

Another interesting property of PCI is its sensitivity to defect tips, which enables accurate sizing of discontinuities. It appears that the specular reflections coming from large scatterers are reduced with respect to amplitude summation, as only a few common phase terms contribute to the summation. Thus, PCI tends to be more robust for narrow and pointed reflectors.

To highlight this characteristic of PCI, this second example will present the inspection results on a steel block that contains a non-surface-breaking notch oriented at 70°, using a SPWZ1-N55S-IHC wedge and a 7.5L60-PWZ1 phased array probe. Figure 7 shows the test configuration.

Figure 8 shows the resulting reconstructed conventional TFM (a) and PCI (b and c) images using the TT-TT propagation mode. The following comparisons can be made:

Thus, even if in this case a conventional TFM image enables a more accurate evaluation of the extent of the notch, PCI enables accurate sizing of notch-like defects, owing to its high sensitivity to defect tips, without using semi-empirical considerations that could be easily misled by a calibration process or attenuation in the material.

Figure 7. Example 2 test configuration: a low-carbon steel block with an angled notch fabricated using electrical discharge machining, an SPWZ1-N55S-IHC wedge, and 7.5L60-PWZ1 probe.

Figure 8. Notch imaging using conventional TFM (a), PCI (b), and PCI with the default colormap of the OmniScan X3 64 flaw detector.

Experimental Findings

In conclusion, our experiments have shown that PCI offers many benefits:

However, some drawbacks of this method should also be mentioned:

References

  1. JF Cruza, J. Camacho, and C. Fritsch, Plane-wave phase-coherence imaging for NDE, NDT & E International, vol. 87, p. 31–37, Apr. 2017.
  2. B. Gauthier, G. Painchaud-April, A. Le Duff, and P. Belanger, “Lightweight and Amplitude-Free Ultrasonic Imaging Using Single-Bit Digitization and Instantaneous Phase Coherence,” IEEE Trans. Ultrason., Ferroelect., Freq. Contr., vol. 69, no. 5, pp. 1763–1774, May 2022, doi: 10.1109/TUFFC.2022.3163621.
  3. B. Gauthier, G. Painchaud-April, A. Le Duff, and P. Bélanger, “Towards an Alternative to Time of Flight Diffraction Using Instantaneous Phase Coherence Imaging for Characterization of Crack-Like Defects,” Sensors, vol. 21, no. 3, p. 730, Jan. 2021, doi: 10.3390/s21030730.
  4. A. Le Duff, N. Badeau, E. Peloquin, G. Painchaud-April, C.-H. Kwan, B. Gauthier, “Total Focusing Method with Phase-Only Ultrasound Signal for Small Flaw Detection,” International Ultrasonic Testing Conference (UT-Online), 2021.
  5. G. Painchaud-April, A. Le Duff, C. Kwan. C. Brillon, Phase-Based Approach for Ultrasonic Inspection, World Intellectual Property Organization (WIPO). 02.09.2021. WO/2021/168565 https://patentscope.wipo.int/search/fr/detail.jsf?docId=WO2021168565=EP383773045

Post Author's Photo

Alain Le Duff

Scientific Project Manager

Alain Le Duff received a PhD in Acoustics from the Université du Mans, France in 2003. He was a professor from 1989 to 2018 at the Polytechnic University of Franceville, Gabon and then at the ESEO, Angers, France, where was the head of the Electronics & Control Engineering Department in 2015. In 2000, he became a Research Fellow at the Laboratoire d’Acoustique de l’Université du Maine, France. In 2018, he joined Evident, now Evident, as a scientist to assist our nondestructive testing (NDT) research and development (R&D). His research interests are related to signal and image processing, acoustics, and electronics. He has also contributed to several R&D programs with French and Canadian labs and companies working in the fields of biomedical and NDT industries.

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Guillaume Painchaud-April

Data Scientist

Guillaume Painchaud-April received his PhD in 2013 from the department of Physics and Physics Engineering at Université Laval, Quebec, Canada for his thesis on the use of the scattering matrix in the analysis of optical dielectric resonators. In 2012, he joined Evident as an industrial physicist, and his current role at Evident is data scientist. His work relates to the physical modeling of wave phenomena in acoustic and electromagnetic inspection systems, on their deployment, and on the use of statistical methods and machine learning methods to improve the reliability of NDE in commercial systems.