Mechanical Impedance Analysis (MIA) Probes

Thickness and Flaw Inspection Solutions

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Please note that product availability varies by region. Contact your local Olympus sales office for more information.

Overview

Features:

Probes

S-MP-3

Order number: 9317796

Part number: U8010011

Specifications
Operation mode: MIA
Probe design: Right angle probe, requires BMM-H for spring loading
Tips: 12.7 mm (0.5 in.) tip diameter
Detection capability: Detects defects in graphite-composite skin bonded to Nomex honeycomb; 2-ply through 7-ply skin thickness. Defects sized 25.4 mm by 50.8 mm; 2-ply through 18-ply. Defect size of 12.7 mm (0.5 in.) or larger.

Typical Applications

  • Can be used on irregular or curved surfaces
  • Suitable for detecting skin-to-core disbonds, crushed core, and other typical skin-to-core bondline defects.
  • Suitable for continuous or mechanical scanning by using spring loading or constant pressure on the probe tip.

S-MP-4

Order number: 9317808

Part number: U8010015

Specifications
Operation mode: MIA
Probe design: Right angle probe, requires BMM-H for spring loading
Tips: 6.35 mm (0.25 in.) tip diameter
Detection capability: Detects on metal to metal defects up to 2 mm (0.08 in.) thickness in the bondline, 6.35 mm (0.25 in.) defect size or larger; and on Fiberglass bonded to a foam core, defect size of 12.7 mm (0.5 in.) or larger, and a maximum skin thickness of 6.35 mm (0.25 in.).

Typical Applications

  • Can be used on irregular or curved surfaces
  • Suitable for detecting skin-to-core disbonds, crushed core, and other typical skin-to-core bondline defects.
  • Suitable for continuous or mechanical scanning by using spring loading or constant pressure on the probe tip.

S-MP-5

Order number: 9322075

Part number: U8770335

Specifications
Operation mode: MIA
Probe design: Right angle probe, adjustable spring tension
Tips: 12.7 mm (0.50 in.) tip diameter
Detection capability: Internally spring-loaded three-position tension adjustments for greater consistency and accuracy. Especially well suited for overhead inspections. Features removable Delrin wear shoe.

Typical Applications

  • Can be used on irregular or curved surfaces
  • Suitable for detecting skin-to-core disbonds, crushed core, and other typical skin-to-core bondline defects.
  • Suitable for continuous or mechanical scanning by using spring loading or constant pressure on the probe tip.

BMM-H Probe Housing

Order number:9316874

Part number: U8770417

Typical Applications
Designed for use with S-MP-03 and S-MP-4 probes. Ensures constant pressure is applied to the part. Also greatly enhances stability while keeping the probe perpendicular to the inspection surface. Incorporates a Teflon wear shoe and spring-loaded probe holder.

Legacy Probes

S-MP-1


Order number: 9317806
Part number: U8010013

Specifications
Operation mode: MIA
Probe design: Right angle probe, not spring-loaded
Tips: 12.7 mm (0.5 in.) tip diameter
Detection capability: Detects defects in graphite-composite skin bonded to honeycomb.

Typical Applications

  • Can be used on irregular or curved surfaces.
  • Suitable for detecting skin-to-core disbonds, crushed core and other typical skin-to-core bondline defects.
  • Used where access is limited.

S-MP-2


Order number: 9317807
Part number: U8010014

Specifications
Operation mode: MIA
Probe design: Straight probe, not spring-loaded
Tips: 6.35 mm (0.25 in.) tip diameter

Typical Applications

  • Can be used on irregular or curved surfaces.
  • Works well on disbonds, crushed core and bond defects on the inside walls of composite structures.
  • Used where access is limited.

Cables

MIA Cable

SBM-CPM-P11

Part Number: 9117789
U8 Number: U8800058

Bondmaster Cable - 11 Pin to 11 Pin cable used on Pitch-Catch and MIA probes, 11 foot (3.3 meters) length.