pasawis

奥林巴斯的近红外显微分光测定仪USPM-RU-W可以高速&高精细地进行可视光区域至近红外区域的大范围波长的分光测定。由于其可以很容易地测定通常的分光光度计所不能测定的细微区域、曲面的反射率,因此十分适用于光学元件与微小的电子部件等产品。

Wheelset Inspection System (PASAWIS)

Thickness and Flaw Inspection Solutions

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Phased Array Semi-Automated Wheelset Inspection System (PASAWIS)

An application-tailored, all-in-one solution, our Phased Array Semi-Automated Wheelset Inspection System (PASAWIS) improves the ease, efficiency, and reliability of maintenance inspections of wheelsets with solid axles.

Complete PA Inspection Solution

PASAWIS uses a combination of the latest ultrasonic and phased array scanning technology and dedicated application software to achieve complete coverage of wheelset components. Increasing inspection speed and reliability, multiple phased array probes electronically scan the targeted area while a dedicated scanner maintains optimal positioning on the component. Exploiting the electronic scanning capacity of phased array probes provides significant improvements in efficiency and coverage compared to the manual scanning of conventional UT. The PASAWIS software is tailored for the application, making it much easier to use than typical ultrasonic or phased array inspection devices.

Complete PA Inspection Solution

Full Coverage of the Axle, Rim, and Tread

PASAWIS can be configured with up to three handheld scanners, each optimized for a different wheelset component: axle, rim, and tread. These dedicated PAUT scanners are designed to fit flush with the component to accelerate inspections through comprehensive coverage, reliably detecting all relevant indications.

4x Faster Inspection Speeds

Perform complete inspection 4x faster with the PASAWIS system compared to conventional UT inspection. Programmed with industry requirements in mind, the acquisition software helps ensure that the mandatory steps of the strictest standards are performed quickly and efficiently.

Maximum Effectiveness with Minimal Training

The software user interface provides a complete guided workflow that optimizes the inspection steps, achieving the effectiveness of an automated system with a semi-automated solution. Thoughtfully designed for wheelset inspection needs, the PASAWIS system is easier to operate than a typical flaw detector.

Consistent, Reliable Results

Control the human impact on data collection and inspection results through this solution’s step-by-step workflow, guiding operators through the entire procedure. With its 2-level access, PASAWIS provides operators with the necessary access to the inspection workflow while making sure the supervisor’s requirements are met. This is key to achieving reliable results that are independent of the operator performing the inspection.

Key Advantages of the Phased Array Semi-Automated Wheelset Inspection System

Consistent, Reliable Results

Dedicated Scanners

Axle Scanner

Axle Scanner

The Axle Scanner is dedicated to solid axle inspections from the shaft and journal positions (typically at the dismounted stage). Using phased array probes, the system inspects the full wheel seat area from both sides, providing automatic transfer correction, a coupling check, and missing data points control to help ensure high-quality data acquisition.

Wheel Rim Scanner

The wheel rim inspection is performed simultaneously in two directions. It uses two phased array probes for the rim area and two conventional UT transducers for the flange area. In a single pass, it enables a complete inspection of the rim, offering an automatic coupling check and missing data points control.

Wheel Rim Scanner
Wheel Tread Scanner

Wheel Tread Scanner

This unique phased array solution for wheel tread inspection provides required reference defects detection in all areas (defined in VPI-EMG 09). Applied directly on wheel tread, the scanner inspects the full width in one pass.

Software

PASAWIS Acquisition and Data Analysis Software

Our dedicated PASAWIS software provides several predefined inspection workflows, optimized for each wheelset component. The software guides the user through all the inspection steps, helping ensure full compliance with your inspection procedure requirements. The software interface is displayed on a large touchscreen monitor that provides clear visualization of the wheelset components and testing data. When the inspection is complete, inspection reports are generated in PDF format with minimal input required from the operator.

Report contents:

PASAWIS Acquisition and Data Analysis Software

Function Check

Verification of NDT device settings and sensitivity is key to performing a proper inspection. With automated or semi-automated solutions, this function check is even more critical due to the mechanics and coupling involved.

PASAWIS inspection software has a built-in safeguard that not only advises you when the last function check was performed, but also prevents you from performing measurements if the function check is overdue. A supervisor can be assigned ownership of the inspection procedure to establish the function check schedule.

Function Check
Measurements

Measurements

The Measurement screen includes all wheelset data and the components that needs to be inspected. Completed inspections are indicated with green checkmark for easy identification. You can create a report at any time, and the software will notify you if any components were missed.

Software Features:

Data Analysis Software for Post-Inspection Review

Delivered with system, PASAWIS data analysis software enables you to review all the recorded data and perform the analysis at any time after the inspection is complete.

Data Analysis Software for Post-Inspection Review
Data Analysis Software for Post-Inspection Review
Data Analysis Software for Post-Inspection Review

Specifications

System Specifications

Phased array channels
64
Number of pulsers
16
Conventional UT channels
4 (8 UT connectors)
Data acquisition rate
Up to 30 MB/s
Acquisition speed
Up to 20000 12-bit A-scans/second of 750 points each
Amplitude resolution
8 bit / 12 bit
Maximum number of A-scan samples
16380
Real-time data compression
1 to 2000 ratio
Rectification
FW, HW+, HW–, and RF
Filtering
Digital band-pass, high-pass, and low-pass filters
Voltage

PA: 4 V, 9 V, 20 V, 40 V, 80 V, and 115 V

UT: 50 V, 100 V, and 190 V

Gain
PA: 80 dB; UT: 120 dB
Pulse width

PA: 30 ns to 500 ns (steps of 2.5 ns)

UT: 30 ns to 1000 ns (steps of 2.5 ns)

Bandwidth (−3 dB)

PA: 0.6 MHz to 17.8 MHz

UT: 0.25 MHz to 28 MHz

Number of beams
Up to 1024
Pulse repetition frequency (PRF)
Up to 20 kHz
Real-time averaging

PA: 2, 4, 8, 16

UT: 2, 4, 8, 16, 32, 64

Encoder
2 axes (quadrature, clock direction)
Network interface
1000BASE-T
IP rating
IP 65

Base Unit Specifications

Axle Scanner Specifications

Wheel Rim Scanner Specifications

Wheel Tread Scanner Specifications

Resources

Product Resources