OmniScan X3 Phased Array Flaw Detector

Every flaw detector in the OmniScan™ X3 series is a complete phased array toolbox. Innovative TFM and advanced PA capabilities help you identify flaws with confidence while powerful software tools and simple workflows improve your productivity.

  • Product Availability:

    The OmniScan X4 has replaced this discontinued product.

OmniScan X3 and OmniScan X3 64 Thickness and Flaw Inspection Solutions

Overview

OmniScan™ X3 64 Phased Array and TFM Flaw Detector with Advanced Capabilities

Power You Can Carry

Housed in the field-proven rugged and portable OmniScan X3 enclosure, the OmniScan X3 64 flaw detector’s powerful focusing capabilities supported by its larger element-aperture capacity enable you to fully exploit 64-element phased array probes and 128-element aperture TFM. Utilize its enhanced performance to meet the inspection challenges of thick and attenuative materials and expand your potential to develop new procedures for a wider range of applications.

Download the OmniScan X3 64 Brochure

How Our Customers Use the OmniScan

Save Time and Energy Screening Welds with the Merged B-Scan

If you’ve ever wondered whether there’s a more efficient way to perform weld screening than simply scrolling through B-scans, you’ll want to hear about our solution. With the MXU 5.13 software update, we introduced an innovative B-scan view for the OmniScan™ X3 series that has the potential to revolutionize this time- and attention-consuming technique. Used as a validation tool, it can give you more confidence in your assessments and help ease the whole B-scan screening process.

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5 Main Advantages of Phase Coherence Imaging (PCI)

With the release of MXU 5.10 software, the OmniScan™ X3 64 flaw detector gains a new advanced ultrasonic inspection technique: phase coherence imaging (PCI). As soon as your OmniScan X3 64 unit is updated, you can start taking advantage of PCI to achieve live total focusing method (TFM) images with unprecedented clarity and sensitivity to small defects.

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Using the Total Focusing Method to Improve Phased Array Ultrasonic Imaging

The nondestructive testing (NDT) industry is experiencing an important technological advancement, as total focusing method (TFM) capable inspection devices are making their entry into the market. The TFM approach represents a significant step forward for phased array ultrasonic testing (PAUT) technology.

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Frequently Asked Questions about Phase Coherence Imaging

What does phase coherence mean?

The phase of an A-scan refers to the frequencies that make up the signal at any given point. Because of the effects of constructive and destructive interference, the A-scan can be described by the phase portion that dictates the signal frequency and an amplitude portion. In phase coherence imaging (PCI)—a variant of total focus method (TFM) imaging—comparing the phase information between A-scans and the level of similarity in their frequency distributions determines the phase coherence. The greater the similarity between the frequency distributions of the A-scans, the higher the level of coherence.

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FAQs about the Open File Format NDE

With the release of MXU 5.11 onboard software for OmniScan™ X3 and X3 64 flaw detectors, the file format of data files created with these devices has changed from .odat to .nde. This change is the beginning of a shift in how NDT data is managed and accessed. It starts with the OmniScan X3 series but will be applied to all future Evident nondestructive testing software and hardware platforms, and hopefully it will be extended to and used by the entire NDT industry.

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OmniScan™ X3 Phased Array Flaw Detector with Innovative TFM

Confidence You Can See

The OmniScan X3 flaw detector is a complete phased array toolbox. Powerful tools, including total focusing method (TFM) imaging and advanced visualization capabilities, backed by its high image quality enable you to complete your inspection with greater confidence.

Download the OmniScan X3 64 Brochure

Innovative and Efficient TFM

Confirm Your TFM Beam Coverage in Advance

The Acoustic Influence Map (AIM) tool provides you with an instant visual model of the sensitivity based on your TFM mode, probe, settings, and simulated reflector.

The AIM tool takes the guesswork out of creating your scan plan—visualize the effect of a wave set (TFM mode), see where sensitivity stops, and adjust your scan plan accordingly.

See What You’ve Been Missing with PCI

Our innovative amplitude-free live phase coherence imaging (PCI) improves small-defect sensitivity and penetration in noisy materials, all while easing your setup and simplifying sizing. Available on the OmniScan X3 64 flaw detector as of MXU 5.10.

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Benefit from 64-Pulser Phased Array

Exploit the full potential of 64-element phased array probes using the OmniScan X3 64 flaw detector to achieve improved resolution at the focal point.

Right-hand image: Acquired using a 32-channel OmniScan X3 unit with a 64-element probe (5L64-A32 model), this S-scan is a high-quality image but the resolution reflects the fact that only the middle 32 elements could be used for the focal law.

Left-hand image: Using a full 64-element aperture (5L64-A32 probe), the OmniScan X3 64 flaw detector provides better PA resolution at the focal point, enabling you to more easily distinguish indications that are close together or in a cluster.

Access Full 128-Element Aperture TFM

Made possible by new generation electronics, TFM imaging offers better focusing capabilities for smaller indications and an improved signal-to-noise ratio (SNR). With its 128-element aperture capacity, the OmniScan X3 64 model provides enhanced image clarity.

Right-hand image: This TFM image was acquired with 64 elements of a 128-element probe (3.5L128-I4 model) using an OmniScan X3 32-channel model.

Left-hand image: Here, the OmniScan X3 64 flaw detector enabled us to use the full 128-element aperture of our 3.5 MHz, 128-element I4 probe. Note the improved resolution and reduced background noise.

Acquire up to 4X Faster TFM

Achieve total focusing method (TFM) acquisition speeds of up to 4 times faster when using a 64-element probe. Compared to models with 32 pulsers, the OmniScan X3 64 flaw detector offers a significant improvement in efficiency owing to its larger aperture capability.

Improved Phased Array

  • Up to 3x as fast as the OmniScan MX2 flaw detector (max pulse repetition frequency)
  • Single TOFD menu for an accelerated calibration workflow
  • 800% high amplitude range reduces the need to rescan
  • Onboard Dual Linear Array™ and Dual Matrix Array™ probe support accelerates setup creation

Ease Corrosion Monitoring Using Phased Array

Using phased array to inspect corrosion offers many benefits, including excellent coverage and resolution. However, becoming proficient in phased array techniques can be challenging. The OmniScan X3 flaw detector combines advanced functions such as gate synchronization with thoughtfully designed software and simplified menus, so you can obtain accurate data more easily. Configure your setup quickly thanks to its A-scan synchronization processing and manual time-corrected gain (TCG).

OmniScan X3 Series

Models OmniScan X3 OmniScan X3 64
Configuration 16:64PR 16:128PR 32:128PR 64:128PR
Applications Corrosion monitoring, Pipeline integrity, Manual PA/TFM, TOFD, Small piping Multi-group high-productivity thin weld PA & TOFD, Wind blade manufacturing, Composite Multi-group high-productivity thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, TFM Multi-group high-productivity very thick weld PA & TOFD, Austenitic/CRA/Disimilar metal weld, High-productivity TFM, High Temperature hydrogen attack (HTHA), Advanced application development
Pulsers (PA) 16 16 32 64
Receivers 64 128 128 128
TFM Elements 32 32 64 128
UT Channels (P/R) 2 2 2 2
Groups Up to 2 (PA, UT/TOFD, TFM)
or 2 PA with 1 TOFD
Up to 8 total
TFM: up to 4
Up to 8 total
TFM: up to 4
Up to 8 total
TFM: up to 4
Bandwidth Frequency 0.5 to 18 MHz 0.2 MHz to 26.5 MHz
Maximum Pulse Width (PA) 500 ns 1000 ns
Voltage PA 40 V, 80 V, and 115 V / Unipolar negative 10 Vpp, 20 Vpp, 40 Vpp, 80 Vpp, 120 Vpp, and 160 Vpp / Bipolar Square Pulse
Internal SSD Storage Capacity

64 GB

1 TB

1 TB
All Other Features and Specifications Identical

Service and Support You Can Trust

From calibration to training, we offer a broad portfolio of services to help you maintain optimal device performance. Evident service contracts are:

Complete Solutions for Your NDT Workflow

MXU

MXU icon

The OmniScan X3 flaw detector’s MXU onboard software guides you through your inspection workflow.

OmniPC

OmniPC icon

Our complimentary OmniPC™ computer-based analysis software is compatible with OmniScan X3, OmniScan MX2, and OmniScan SX data files.

WeldSight

WeldSight icon

WeldSight™ advanced analysis and acquisition PC software is compatible with the OmniScan X3 flaw detector. For increased productivity, the WeldSight Remote Connect app installed on the acquisition unit enables you to perform the entire inspection workflow using WeldSight software.

Applications

Solutions

Industrial Scanners

The capacity to accurately position probes according to the surface being inspected greatly influences inspection quality. Evident offers a wide range of industrial scanners and accessories to assist inspectors in their work. Scanners come in various configurations including one or two encoded axes with manual or motorized motion.

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Weld Inspection Solutions

Evident versatile weld solution uses a variety of techniques and scanning tools to achieve a productive and efficient inspection. Phased array, TOFD, and conventional ultrasonic techniques can be used alone or in combination to achieve full-weld coverage with high probability of detection.

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Corrosion Inspection Solutions

Evident has a wide range of innovative products utilizing advanced technologies for the manual or automated inspections of internally corroded pipes and tanks, high-temperature surfaces, corrosion mapping of large pressurized vessels and stress corrosion cracking are typical applications that require either manual or automated inspections.

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Composite Inspection Solutions

Our composite inspection solutions include portable and integrated inspection instruments that are powerful and fast. Options are available for inspecting several different types of composite and honeycomb parts. Ultrasound and bond testing technologies are packaged with application-specific scanners and probes to address different maintenance or manufacturing industry needs.

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HTHA Inspection Solutions

Confidently detect and define complex damage mechanisms such as high-temperature hydrogen attack (HTHA) through the optimal pairing of Evident’s high-sensitivity multielement probes with the advanced imaging capabilities of our data acquisition instruments.

These reliable solutions provide clear high-resolution images that increase your probability of detection and enable you to perform precise severity assessments to maintain the integrity of your assets.

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Onboard Software

MXU

PAUT, TOFD, and TFM Inspection and Analysis Software

The OmniScan X3 flaw detector’s MXU onboard software provides streamlined, simplified menus and advanced yet intuitive tools to guide you through your inspection workflow using UT, PA, TOFD, and TFM methods, from setup to reporting.

Ease Your NDT Workflow Using Built-In Tools

1. Scan Plan

Follow the steps—1, 2, 3—to set up your inspection on board

2. Calibration

Conduct a fully compliant calibration using the built-in tools

3. Acquisition

View the live scan results during your inspection

4. Analysis

Quickly and confidently interpret your data

Live TFM Envelope Processing

Facilitate Flaw Characterization and Sizing

The instrument’s unique envelope processing provides high-resolution TFM images. Indications look clean and sharp and stand out more clearly against background noise. Up to four TFM modes facilitate interpretation and sizing.

Expand Your PA and TFM Capabilities

Increase your potential to meet the challenges of your customers and develop new procedures for a wider range of applications. Gain the power to drive advanced PA probes such as our Dual Liner Array™ or Dual Matrix Array™ probes or customized probes to achieve higher quailty imaging of acoustically challenging materials.

When Precision Is Paramount

See Clearly with Lower Frequencies and Wider Bandwidth

  1. Versus the 32-channel model, the 64-channel model provides a higher signal-to-noise ratio (SNR) on a larger bandwidth for higher and lower frequencies.
  2. Capable of driving lower frequencies using a larger pulse width, the OmniScan X3 64 flaw detector offers better signal resolution on attenuative materials such as composites.
  3. In C-scans, the 64-channel model’s higher resolution and SNR reveal more features in finer detail, enabling you to achieve greater precision when required.

Fix Errors before They Are Made: Improved PAUT and TOFD Data Quality and Reliability

The coupling check channel feature of the OmniScan X3 flaw detector, combined with the ScanDeck™ module’s real-time coupling and scan speed indicators help inspectors monitor data quality before the file is saved.* The coupling quality data is recorded and can be reviewed later.

*The ScanDeck module is available on certain scanners, such as the AxSEAM scanner, as of July 2020.

Avoid Signal Saturation on Large Indications

Easy Gain Adjustment with 800% Amplitude Range

Improve inspection efficiency by eliminating unnecessary rescanning. The high 800% amplitude range enables you to adjust the gain of large indications, such as lack of fusion, to reference level in post processing, avoiding the need to rescan.

Confirm TFM Beam Coverage in Advance

The Acoustic Influence Map (AIM) provides you with an onboard visual model of the sensitivity based on the TFM mode, probe, settings, and simulated reflector. The AIM tool takes the guesswork out of creating your scan plan, enabling you to adjust it accordingly.

Obtain clear data on the projected highest sensitivity area.

See which TFM modes provide the best cover your area of interest.

The higher the Sensitivity Index, the better the expected signal-to-noise ratio (SNR).

Simulate the TFM mode sensitivity on a spherical or planar defect.

Complete OmniScan Retrocompatibility for Your Convenience

Reuse your data files from previous versions of OmniPC software and setup files from OmniScan MX2, SX, and MX flaw detectors. To ease your transition, OmniScan .ops setup files are compatible with the OmniScan X3 flaw detector, and .opd data files are compatible with OmniPC 5 and WeldSight software.

TOFD Lateral Wave Processing

Lateral wave synchronization improves the readability of time-of-flight diffraction (TOFD) data.

  • A straighter lateral wave enables more precise depth evaluation and flaw sizing.
  • Detect indications closer to the surface, using the lateral wave removal function.
  • Lateral wave processing can be done per section, providing better flexibility.

OmniPC 5 Software

Phased Array and Ultrasonic Testing Data Analysis PC Software

OmniPC analysis software is the computer-based companion software for the OmniScan X3 flaw detector. An inspection tool created by inspectors, OmniPC software provides the power and performance to handle all your basic data analysis and reporting needs.

Why OmniPC?

Optimized for NDT Inspectors

Like the on-board software of the OmniScan X3 flaw detector, OmniPC software enables inspectors using UT, PA, TOFD, and TFM to perform efficient analysis and reporting on a PC or laptop.

Complimentary Companion Software for OmniScan Flaw Detectors

OmniPC software is free for download, including updates, by subscribing here:

  • No HASP key
  • No product key
  • No renewal payments
Complementary Companion Software for OmniScan Flaw Detectors

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User-friendly features including convenient shortcuts, the flexibility to use different methods, and the ability to open multiple sessions on one computer increase the efficiency your analysis.

Familiar OmniScan User Interface

The user interface of OmniPC software resembles the OmniScan X3 on-board software to ease your learning curve.

Flexible Tools to Ease Your PAUT and TOFD Data Analysis

Correct Oversights Made during Acquisition

OmniPC software’s Skew, Scan Offset, and Index Offset can be changed during post-inspection analysis to improve data accuracy and avoid reacquisition.

Adjustable Gates and Dynamic Readings

Gates A, B, and I are available with various lists of readings (for corrosion inspections).

Replay the Acquisition

At any time, adjust the Gain, apply the Auto 80%, and slide the Data cursors.

Identify Indications with Ease

Use the gate in True Depth or Sound Path or change the Zoom Palette to locate indications faster.

TOFD Recalibration

Recalibrate your wedge delay and PCS in your TOFD files. Synchronize and remove the lateral wave as required.

Specifications

OmniScan® X3 Series Specifications

These specifications apply to all OmniScan X3 and OmniScan X3 64 models.

Type Multigroup, multimode ultrasonic flaw detector
Size (W × H × D) 335 mm x 221 mm x 151 mm (13.2 in. x 8.7 in. x 5.9 in.)
Weight 5.7 kg (12.6 lb) (with 1 battery)
Hard Drive Capacity OmniScan X3 : Internal 64 GB SSD
OmniScan X3 64 : Internal 1TB SSD
extendable using an external USB drive
Storage Devices SDHC and SDXC cards or most standard USB storage devices
Compatible only with NTFS and FAT32 formats.
Max Onboard File Size 25 GB
GPS Yes (unless specified otherwise for some regions)
Alarms 3
Wireless Connection Yes – wireless LAN dongle included in the package (model varies according to region)
PA Connectors 1 connector
UT Connectors 4 (2 channels P/R)
Certifications ISO 18563-1:2015
ISO-22232-1:2020
Display
Type TFT LCD with resistive touch screen
Size 269 mm (10.6 in.)
Resolution 1280 × 768 pixels
Number of Colors 16 million
Viewing Angles Horizontal: −85° to 85°
Vertical: −85° to 85°
I/O Ports
USB 2.0 2 ports (one hidden behind the battery)
USB 3.0 1 port
Video Output Video out (HDMI)
Memory Card SDHC port
Communication Ethernet
I/O Lines
Encoder 2-axis encoder line (quadrature quadrature direction)
Digital Input 6 digital inputs, TTL
Digital Output 5 digital outputs, TTL
Acquisition On/Off Switch Through the configuration of a digital input
Power Output Line 5 V nominal, 1 A (short-circuit protected), and 12 V output at 1 A
External DC Supply
DC-IN Voltage 15 VDC to 18 VDC (min. 50 W)
Connector Circular, 2.5 mm pin diameter, center-positive
Battery
Type Lithium-ion battery
Capacity 87 Wh
Number of Batteries 2
Life 5 hours using 2 batteries (hot-swap capable)
PA/UT Configuration
Bit Depth 16 bits
Maximum PRF 20 kHz
Frequency
Effective Digitizing Frequency Up to 100 MHz
Display
Refresh Rate A-scan: 60 Hz; S-scan: 20 Hz to 30 Hz
Envelope (echo-dynamic mode) Yes: Volume-corrected S-scan (30 Hz)
A-Scan Height Up to 800%
Synchronization
On Internal Clock 1 Hz to 10 kHz
External Pace Yes
On Encoder On 2 axes: from 1 to 65,536 steps

Data Specifications
---

Processing
Maximum Number of A-Scan Data Points Up to 16,384
Real-Time Averaging PA: 2, 4, 8, 16
UT: 2, 4, 8, 16, 32, 64
Rectification RF, full wave, half wave+, half wave-
Filtering PA channel (OmniScan X3): 8 low-pass, 6 band-pass, and 4 high-pass filters
PA channel (OmniScan X3 64): 9 band-pass and 7 high-pass filters
UT channel: 8 low-pass, 6 band-pass, and 4 high- pass filters (3 additional filters when configured in TOFD)
Video Filtering Smoothing (adjusted to the probe frequency range)
Programmable TCG
Number of Points 32: One TCG (time-corrected gain) curve per focal law
Range PA (standard): 40 dB per step of 0.1 dB
UT: 100 dB per step of 0.1 dB
Maximum Slope PA (standard): 40 dB/10 ns
UT: 40 dB/10 ns

Acoustic Specifications

Model
OmniScan X3
OmniScan X3 64
Both
Pulser
PA Channel
PA Channel
UT Channels
Voltage
40 V, 80 V, and 115 V
10 Vpp, 20 Vpp, 40 Vpp, 80 Vpp, 120 Vpp, and 160 Vpp
85 V, 155 V, and 295 V
Pulse Width
Adjustable from 30 ns to 500 ns; resolution of 2.5 ns
Adjustable from 30 ns to 1000 ns (half period of bipolar pulse or duration of negative of pulse); resolution of 5 ns
Adjustable from 30 ns to 1,000 ns; resolution of 2.5 ns
Fall Time
< 10 ns
< 10 ns
< 10 ns
Pulse Shape
Negative square pulse
Bipolar negative-positive square pulse Negative square pulse
Output Impedance
28 Ω in pulse-echo
24 Ω in pitch-catch
35 Ω
< 30 Ω
Receiver
PA Channel
-
UT Channels
Gain Range
0 dB to 80 dB maximum input signal; 550 mVp-p (full-screen height).
0 dB to 80 dB; maximum input signal 900 mVp-p (full-screen height).
0 dB to 120 dB maximum input signal; 34.5 Vp-p (full-screen height).
Input Impedance
57 Ω ± 10% at 9 MHz in pulse-echo
100 Ω ± 10% at 9 MHz in pitch-catch
120 Ω ±10 % at 13 MHz
50 Ω in pulse-echo mode
50 Ω in pulse-receive mode
System Bandwith
0.5 MHz to 18 MHz
0.2 MHz to 26.5 MHz
0.25 MHz to 28 MHz
Beam Formation
PA Channel
-
UT Channels
Scan Type
Single, linear, sectorial, compound, and TFM
-
-
Maximum Aperture
OMNIX3-PATFM1664PR = 16 elements
OMNIX3-PATFM16128PR = 16 elements
OMNIX3-PATFM32128PR = 32 elements
OMNIX3-PATFM64128PR = 64 elements
-
Number of Receiving Elements
OMNIX3-PATFM1664PR = 64 receiving elements
OMNIX3-PATFM16128PR = 128 receiving elements
OMNIX3-PATFM32128PR = 128 receiving elements
OMNIX3-PATFM64128PR =128 elements
-
Number of Focal Laws
Up to 1024
-
-
Delay Range Transmission
0 µs to 10 µs in 2.5 ns increments
0 µs to 10 µs in 5 ns increments
-
Delay Range Reception
0 µs to 6.4 µs in 2.5 ns increments
-
-

TFM/FMC
---

Supported Modes
Pulse-echo: L-L, T-T, and TT-TT
Self-tandem: LL-L, TT-T, TT-L, TL-T, LT-T, TTT-TT, and TL-L
Number of Groups
Up to 4 simultaneous TFM groups
Maximum Aperture
64-element aperture for 64:128PR
64-element extended aperture (32:128PR only)
32-element extended aperture for 16:64PR and 16:128PR
128-element extended aperture for 64:128PR
Image Resolution
Up to 1024 × 1024 (1 M points) for each TFM group
Live TFM Envelope
Yes

Operating Environment
---

Ingress Protection Rating
IP65 certified (completely protected against dust and water jets from all directions (6.3 mm nozzle))
Shockproof Rating
Drop tested according to MIL-STD-810G
Intended Use
Indoor and outdoor use
Altitude
Up to 2,000 m (6,561 ft)
Operating Temperature
−10 °C to 45 °C (14 °F to 113 °F)
Storage Temperature
−20 °C to 60 °C (−4 °F to 140 °F) (with battery inside)
−20 °C to 70 °C (−4 °F to 158 °F) (with no battery inside)

Resources

Application Notes

Insights

Tutorials

Product Resources